NSF award 2629289 · Gordon Research Conferences

Conference: 2026 Defects in Semiconductors GRC

Final report due

31 May 2027

in 225 days · The award ends on 31 January 2027.

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Dates this award owes

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Extension request17 Dec 2026in 60 days
award ending 2027-01-31 · Research.gov
PAPPG 24-1: “at least 45 days prior to the end date”
No-cost extension notice21 Jan 2027in 95 days
award ending 2027-01-31 · Research.gov
PAPPG 24-1: “at least ten calendar days prior to the end date”
Final report due31 May 2027in 225 days
award ending 2027-01-31 · Research.gov
PAPPG 24-1: “no later than 120-days following the end date of the award”
Project outcomes report due31 May 2027in 225 days
award ending 2027-01-31 · Research.gov
PAPPG 24-1: “no later than 120 days following the end date”
Award is closed out31 May 2027in 225 days
award ending 2027-01-31 · Research.gov
PAPPG 24-1: “financially closed out 120 days after their expiration date”

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NSF lists this award's end date as 31 January 2027.
NSF rules say the final report is due no later than 120 days after that.
So the final report is due by 31 May 2027.

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Award card

Award number: 2629289
Period of support: 1 Aug 2026 – 31 Jan 2027
Amount: $10,000
Awardee: Gordon Research Conferences, East Greenwich, RI
Program: ELECTRONIC/PHOTONIC MATERIALS
Directorate: MPS

Abstract

Nontechnical description Semiconductors are foundational materials for modern technology. They are the basis for everything from communications and electronics to artificial intelligence and quantum technologies. Defects are critical to the performance of any semiconductor device. They can be unintentional impurities or crystal imperfections that degrade device efficiency and reliability. They can also be…

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